Your search returned 9 records. Click on the hyperlinks to view further details of Titles..
Magazine Name : Microelectronics Journal
Year : 2003Volume number : 34Issue:01
Scan Flip-Flops With On-Line Testing Ability With Respect To Input Dealy And Crosstalk Faults(Article) Subject:
On-Line Testing
Author:
C
Metra
page:
24
-
30
Parallel Testing Of Multi-Port Static Random Access Memories(Article) Subject:
Memory Testing
,
Embedded Memories
Author:
F
Karimi
page:
3
-
22
Concurrent Error Detection Of Fault-Based Side-Channel Cryptanalysis Of 128-Bit Rc6 Block Cipher(Article) Subject:
Concurrent Error Detection
,
Cryptanalysis
Author:
Kaijie
Wu
page:
31
-
40
Study, Comparison And Applicantion Of Different Vhdl-Based Fault Injection Tecniques For The Experimental Validation Of A Fault-Tolerant System(Article) Subject:
Dependability
,
Validation
Author:
D
Gil
page:
41
-
52
New Techniques For Efficiently Assessing Relibility Of Socs(Article) Subject:
System-On-A-Chip
,
Single Event Upset
Author:
P
Civera
page:
53
-
62
The Measurement Of The Dielectric And Optical Properties Of Nano Thin Film S By Thz Differential Time-Domain Spectroscopy(Article) Subject:
Thz Differential Time-Domain Spectroscopy
,
Thin Film
Author:
Kwang-Su
Lee
page:
63
-
69
Numerical Investigation Of Characteristucs P-Channel Ge/Si Hetero-Nanocystal Memory(Article) Subject:
Ge/Si
,
Nanocrystal
,
Memory
Author:
H.G
Yang
page:
71
-
76
Extraction Techniqu For Characterization Of Electric Field Distribution And Drain Current In Vdmos Power Transistor(Article) Subject:
Silicon Vdmos
,
Power Mosfet
Author:
N
Kaushik
page:
77
-
84
Analog Signal Generator For Bist Of Weband If Signals Bandpass Sigma-Delta Modulator(Article) Subject:
Digital Intermediate Frequency
Author:
Feng
Huang
page:
-
-
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